SYSTEMS

SAN JOSE, CA -- LogicVision, Inc. (Nasdaq:LGVN), a leading provider of embedded test IP solutions, today announced that Sun Microsystems, Inc. (Nasdaq:SUNW - news) has signed a multi-year agreement that deploys LogicVision's Embedded Test Solutions. Sun plans to use LogicVision's embedded test throughout Sun's IC design activities, enabling Sun to leverage the test methodologies solution from IC design to end system product. ``Our previous experience with LogicVision's Embedded Test Solutions demonstrated the usefulness of test capabilities that span our hardware development and manufacturing environment,'' said Sunil Joshi, vice president of Design Automation & Computer Resources for Sun Microsystems. ``LogicVision offers an integrated methodology which has potential for reducing test costs, improved resource utilization, and allowing higher degrees of test re-use.'' To achieve the re-use of test that spans Sun's product lifetime, Sun is using a broad set of embedded test capabilities from LogicVision's family of embedded test functions: -- Embedded hierarchical logic test and memory test; -- External memory test for board and systems; and -- Core test and chip test assembly. ``This engagement represents Sun's acceptance of LogicVision's embedded test products as important solutions that overcome many of the test and diagnostic challenges facing the electronics industry,'' said Vinod Agarwal, president and CEO of LogicVision. ``We strongly believe that as system complexity increases, the benefits of embedded test will also become increasingly more apparent to other companies tasked with delivering reliable systems to the marketplace.''